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revisions ltr description date (yr-mo-da) approved a added device type 02. updated paragraph 4.3.5 to include radhard requirements. 01-10-26 raymond monnin rev sheet rev sheet rev status rev a a a a a a a a a a a a a of sheets sheet 1 2 3 4 5 6 7 8 9 10 11 12 13 pmic n/a prepared by gary zahn defense supply center columbus standard microcircuit drawing checked by michael c. jones columbus, ohio 43216 http://www.d scc.dla.mil this drawing is available for use by all departments approved by raymond monnin and agencies of the department of defense drawing approval date 00-10-16 microcircuit, hybrid, linear, 3.3-volt, single channel, dc-dc converter amsc n/a revision level a size a cage code 67268 5962-01501 sheet 1 of 13 dscc form 2233 apr 97 5962-e005-02 distribution statement a . approved for public release; distribution is unlimited.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 2 dscc form 2234 apr 97 1. scope 1.1 scope . this drawing documents five product assurance cl asses as defined in paragraph 1.2.3 and mil-prf-38534. a choice of case outlines and lead finishes which are available and are reflected in the part or identifying number (pin). when available, a choice of radiation hardness a ssurance levels are reflected in the pin. 1.2 pin . the pin shall be as shown in the following example: 5962 - 01501 01 h x x ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? federal rha device device case lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) \ / (see 1.2.3) \/ drawing number 1.2.1 radiation hardness assurance (rha) designator . rha marked devices shall meet the mil-prf-38534 specified rha levels and shall be marked with the appropriate rha designator. a dash (-) indicates a non-rha device. 1.2.2 device type(s) . the device type(s) identify the circuit function as follows: device type generic number circuit function 01 mtr283r3s/883, mtr283r3sf/883 dc-dc converter, 20 w, +3.3 v output 02 smtr283r3s, smtr283r3sf dc-dc converter, 18 w, +3.3 v output 1.2.3 device class designator . this device class designator shall be a single letter identifying the product assurance level. all levels are defined by the requirement s of mil-prf-38534 and require qml certification as well as qualification (class h, k, and e) or qml listing (class g and d). the product assurance levels are as follows: device class device performance documentation k highest reliability class available. this level is intended for use in space applications. h standard military quality class level. this level is intended for use in applications where non-space high reliabilit y devices are required. g reduced testing version of the standard milit ary quality class. this level uses the class h screening and in-process inspections with a possible limited temperature range, manufacturer specified incoming fl ow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (group a, b, c and d). e designates devices which are based upon one of the other classes (k, h, or g) with exception(s) taken to the requirements of that class. these exception(s) must be specified in the device acquisition doc ument; therefore the acquisition document should be reviewed to ensure that the except ion(s) taken will not adversely affect system performance. d manufacturer specified quality class. q uality level is defined by the manufacturers internal, qml certified flow. this product may have a limited temperature range.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 3 dscc form 2234 apr 97 1.2.4 case outline(s) . the case outline(s) are as designated in mil-std-1835 and as follows: outline letter descriptive designator terminals package style x see figure 1 10 dual-in-line z see figure 1 10 flange mount 1.2.5 lead finish . the lead finish shall be as specified in mil-prf-38534. 1.3 absolute maximum ratings . 1 / input voltage range .................................................................... -0.5 v dc to +50 v dc power dissipation (p d ): device types 01 and 02 (non-rha) ....................................... 12 w device type 02 (rha level r) ................................................ 14 w output power: device type 01 (non-rha) ..................................................... 20.6 w device type 02 (non-rha) ..................................................... 18.5 w device type 02 (rha level r) ................................................ 19.1 w lead temperature (hand solder ing, 10 sec onds)....................... +300 c storage temperature range ....................................................... -65 c to +150 c 1.4 recommended operating conditions . input voltage range ..................................................................... +16 v dc to +40 v dc case operating temperature range (t c )...................................... -55 c to +125 c 2. applicable documents 2.1 government specification, standards, and handbooks . the following specification, standards, and handbooks form a part of this drawing to the extent specified herein. unless ot herwise specified, the issues of these documents are those liste d in the issue of the department of defense i ndex of specifications and standards (dodi ss) and supplement thereto, cited in the solicitation. specification department of defense mil-prf-38534 - hybrid microcircu its, general specification for. standards department of defense mil-std-883 - test method standard microcircuits. mil-std-1835 - interface standard fo r electronic component case outlines. 1 / stresses above the absolute maximum ratings may cause permanent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 4 dscc form 2234 apr 97 handbooks department of defense mil-hdbk-103 - list of standard microcircuit drawings. mil-hdbk-780 - standard microcircuit drawings. (unless otherwise indicated, copies of the specificat ion, standards, and handbook are available from the standardization document order desk, 700 robbins avenue, building 4d, philadelphia, pa 19111-5094.) 2.2 order of precedence . in the event of a conflict between the text of th is drawing and the references cited herein, the text of this drawing takes precedence. nothing in this docum ent, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. requirements 3.1 item requirements . the individual item performance requirements fo r device classes d, e, g, h, and k shall be in accordance with mil-prf-38534. compliance with mil-prf- 38534 may include the performance of all tests herein or as designated in the device manufacturer's quality management (qm) plan or as designated for the applicable device class. therefore, the tests and inspections herein may not be per formed for the applicable device class (see mil-prf-38534). furthermore, the manufacturer may take ex ceptions or use alternate methods to the tests and inspections herein and not perform them. however, the performanc e requirements as defined in mil-prf-38534 shall be met for the applicable device class. 3.2 design, construction, and physical dimensions . the design, construction, and physica l dimensions shall be as specified in mil-prf-38534 and herein. 3.2.1 case outline(s) . the case outline(s) shall be in a ccordance with 1.2.4 herein and figure 1. 3.2.2 terminal connections . the terminal connections sha ll be as specified on figure 2. 3.3 electrical perfo rmance characteristics . unless otherwise specified herein, the electrical performance characteristics are as specified in table i and shall apply over the full specified operat ing temperature range. 3.4 electrical test requirements . the electrical test requirements shall be the subgroups specified in t able ii. the electrical tests for each subgroup are defined in table i. 3.5 marking of device(s) . marking of device(s) shall be in accordanc e with mil-prf-38534. the device shall be marked with the pin listed in 1.2 herein. in addition, the manufacturer's vendor similar pin may also be marked. 3.6 data . in addition to the general performance requirements of mil-prf-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables fo rmat) from the initial quality c onformance inspection group a lot sample, for each device type listed herein. also, the data shoul d include a summary of all parameters manually tested, and for those which, if any, are guaranteed. this data shall be mainta ined under document revision level control by the manufacturer and be made available to the preparing activity (dscc-va) upon request. 3.7 certificate of compliance . a certificate of compliance shall be required fr om a manufacturer in or der to supply to this drawing. the certificate of compliance (o riginal copy) submitted to dscc-va shall a ffirm that the manufacturer's product meets the performance requirements of mil-prf-38534 and herein. 3.8 certificate of conformance . a certificate of conformance as required in mil-prf-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. quality assurance provisions 4.1 sampling and inspection . sampling and inspection procedures shall be in accordance with mil-prf-38534 or as modified in the device manufacturer's quality management (qm) pl an. the modification in the qm plan shall not affect the form, fit, or function as described herein.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 5 dscc form 2234 apr 97 table i. electrical per formance characteristics . limits test symbol conditions -55 c t c +125 c v in = 28v dc 0.5v no external sync, c l =0 unless otherwise specified group a subgroups device types min max unit 1 3.267 3.333 i out = max 2,3 01, 02 3.201 3.399 output voltage v out r 1, 2, 3 02 3.102 3.498 vdc 01 0.0 6060 output current i out v in = 16 v dc to 40v dc 1, 2, 3 02 0.0 5450 ma 1 40 i out = max, bw = 10khz to 2mhz 2,3 01, 02 50 v out ripple voltage v rip r 1, 2, 3 02 100 mvp-p v in = 16v dc to 40v dc, i out = 6.06 a 01 10 v in = 16v dc to 40v dc, i out = 5.45 a 1, 2, 3 02 20 v out line regulation vr line r 1, 2, 3 02 40 mv i out = 0 to 6.06 a 01 10 i out = 0 to 5.45 a 1, 2, 3 02 20 v out load regulation vr load r 1, 2, 3 02 40 mv i out = 0 a, inhibit (pin 2) = 0 1, 2, 3 01, 02 8 r 1, 2, 3 02 10 ma i out = 0 a, inhibit (pin 2) = open 1, 2, 3 01, 02 75 input current i in r 1, 2, 3 02 175 ma i out = max bw = 10khz to 10mhz 1, 2, 3 01, 02 50 i in ripple current i rip r 1, 2, 3 02 65 map-p 1 01, 02 10 short circuit 2, 3 01, 02 12 short circuit power dissipation p d r 1, 2, 3 02 14 w see footnotes at end of table.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 6 dscc form 2234 apr 97 table i. electrical per formance characteristics - continued. limits test symbol conditions -55 c t c +125 c v in = 28v dc 0.5v no external sync, c l = 0 unless otherwise specified group a subgroups device types min max unit i out = 6.06 a 01 74 i out = 5.45 a 1 02 70 i out = 6.06 a 01 71 i out = 5.45 a 2, 3 02 66 efficiency eff r 1, 2, 3 02 64 % isolation iso input to output or any pin to case (except pins 7 and 8) at 500v dc 1 01, 02 100 m ? capacitive load 1 / 2 / c l no effect on dc performance 4 01, 02 300 f i out = max 4, 5, 6 01, 02 550 650 switching frequency f s r 4, 5, 6 02 400 750 khz i out = max, ttl level to pin 9 4, 5, 6 01, 02 500 675 external sync range 3 / f sync r 4, 5, 6 02 550 650 khz 01 -250 +250 50% load to/from 100% load 4, 5, 6 02 -300 +300 v out , step load transient 4 / v tload r 4, 5, 6 02 -600 +600 mv pk 50% load to/from 100% load 4, 5, 6 01, 02 200 v out , step load transient recovery 2 / 4 / 5 / tt load r 4, 5, 6 02 600 s input step 16v dc to/from 40v dc, i out = max 4, 5, 6 01, 02 -300 +300 v out , step line transient 2 / 6 / v tline r 4, 5, 6 02 -600 +600 mv pk see footnotes at end of table.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 7 dscc form 2234 apr 97 table i. electrical per formance characteristics - continued. limits test symbol conditions -55 c t c +125 c v in = 28v dc 0.5v no external sync, c l = 0 unless otherwise specified group a subgroups device types min max unit input step 16v dc to/from 40v dc, i out = max 4, 5, 6 01, 02 300 v out , step line transient recovery 2 / 5 / tt line r 4, 5, 6 02 800 s i out = max 4, 5, 6 01, 02 50 start-up overshoot 2 / vton os r 4, 5, 6 02 120 mv pk i out = max 4, 5, 6 01, 02 5 start-up delay 7 / ton d r 4, 5, 6 02 20 ms i out = max 4, 5, 6 01, 02 6 load fault recovery 2 / tr lf r 4, 5, 6 02 20 ms 1 / capacitive load may be any value from 0 to the maximum limit without compromising dc performance. 2 / parameter shall be tested as part of device characterization and after design and process changes. these parameters shall be guaranteed to the limits specified in table i for all lots not specifically tested. 3 / a ttl level waveform (v ih = 4.5 v minimum, v il = .8 v maximum) with a 50% 10% duty cycle applied to the sync pin (pin 6) within the sync range frequency shall cause the c onverter?s switching frequency to become synchronous with the frequency applied to the sync input pin (pin 9). 4 / load step transition time is 10 microseconds maximum. 5 / recovery time is measured from t he initiation of the transient until v out has returned to within 1 percent of v out final value. 6 / input step transition time greater than 10 microseconds. 7 / turn-on delay time measurement is eit her for a step application of power at t he input or the removal of a ground signal from the inhibit pin (pin 2) while power is applied to the input.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 8 dscc form 2234 apr 97 case outline x. symbol millimeters inches min max min max a 10.16 0.400 b 0.89 1.14 0.035 0.045 e 10.16 bsc 0.400 bsc e 28.07 28.32 1.105 1.115 l 6.09 6.60 0.240 0.260 q 53.21 2.095 q1 24.26 bsc 0.955 bsc s1 6.22 bsc 0.245 bsc s2 3.94 bsc 0.155 bsc notes: 1. the case outline x was originally designed using the in ch-pound units of measurement, in the event of conflict between the metric and inch-pound units, t he inch-pound units shall take precedence. 2. device weight: 52 grams. figure 1. case outline(s) .
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 9 dscc form 2234 apr 97 case outline z. symbol millimeters inches min max min max a 10.16 0.400 a1 1.27 1.78 0.050 0.070 b 0.89 1.14 0.035 0.045 d 73.66 2.900 e 10.16 bsc 0.400 bsc e 28.07 28.32 1.105 1.115 l 6.09 6.60 0.240 0.260 p 3.99 4.19 0.157 0.165 q 53.08 bsc 2.090 bsc q1 5.84 bsc 0.230 bsc q2 14.10 bsc 0.555 bsc q3 24.26 bsc 0.955 bsc q4 64.52 65.02 2.540 2.560 r 4.19 4.44 0.165 0.175 s1 6.22 bsc 0.245 bsc s2 3.94 bsc 0.155 bsc notes: 1. the case outline z was originally designed using the in ch-pound units of measurement, in the event of conflict between the metric and inch-pound units, t he inch-pound units shall take precedence. 2. unless otherwise specified, the tolerance is .01 for two place decimals and .005 for three place decimals. 3. device weight: 55 grams maximum. figure 1. case outline(s) - continued.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 10 dscc form 2234 apr 97 device types 01 and 02 case outlines x and z terminal number terminal symbol 1 positive input 2 inhibit 3 sense return 4 output common 5 positive output 6 positive sense 7 case ground 8 case ground 9 sync input 10 input common figure 2. terminal connections .
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 11 dscc form 2234 apr 97 table ii. electrical test requirements . mil-prf-38534 test requirements subgroups (in accordance with mil-prf-38534, group a test table) interim electrical parameters final electrical parameters 1*, 2, 3, 4, 5, 6 group a test requirements 1, 2, 3, 4, 5, 6 group c end-point electrical parameters 1 end-point electrical parameters for radiation hardness assurance (rha) devices 1, 2, 3, 4, 5, 6 * pda applies to subgroup 1. 4.2 screening . screening shall be in accordance with mil-prf- 38534. the following additional criteria shall apply: a. burn-in test, method 1015 of mil-std-883. (1) test condition a, b, c, or d. the test circuit sha ll be maintained by the manufacturer under document revision level control and shall be made available to either dscc-va or t he acquiring activity upon request. also, the test circuit shall specify the inputs, outputs, biases, and power dissi pation, as applicable, in accordance with the intent specified in test method 1015 of mil-std-883. (2) t a as specified in accordance with table i of method 1015 of mil-std-883. b. interim and final electrical test parameters shall be as spec ified in table ii herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 conformance and periodic inspections . conformance inspection (ci) and periodi c inspection (pi) shall be in accordance with mil-prf-38534 and as specified herein. 4.3.1 group a inspection (ci) . group a inspection shall be in accordance with mil-prf-38534 and as follows: a. tests shall be as specified in table ii herein. b. subgroups 7, 8, 9, 10 and 11 shall be omitted. 4.3.2 group b inspection (pi) . group b inspection shall be in accordance with mil-prf-38534.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 12 dscc form 2234 apr 97 4.3.3 group c inspection (pi) . group c inspection shall be in accordance with mil-prf-38534 and as follows: a. end-point electrical parameters shall be as specified in table ii herein. b. steady-state life test, method 1005 of mil-std-883. (1) test condition a, b, c, or d. the test circuit sha ll be maintained by the manufacturer under document revision level control and shall be made available to either dscc-va or t he acquiring activity upon request. also, the test circuit shall specify the inputs, outputs, biases, and power dissi pation, as applicable, in accordance with the intent specified in test method 1005 of mil-std-883. (2) t a as specified in accordance with table i of method 1005 of mil-std-883. (3) test duration: 1,000 hours, except as permitted by method 1005 of mil-std-883. 4.3.4 group d inspection (pi) . group d inspection shall be in accordance with mil-prf-38534. 4.3.5 radiation hardness assurance (rha) . rha qualification is required only for those devices with the rha designator as specified herein. rha level r units total ionizing dose tolerance level 100 krad(si) single event upset survival level (let) 40 mev a. radiation dose rate is in accordance with condition c of method 1019 of mil-std-883. unless otherwise specified, components are tested at a rate of 9 rad(si)/s, in acco rdance with method 1019 of mil-std-750 or mil-std-883, as applicable. b. the manufacturer shall perform a worst-case and radi ation susceptibility analysis on the device. this analysis shall show that the minimum performance require ments of each component has adequate design margin under worst-case operating conditions (extremes of line volt age, temperatures, load, fr equency, radiation enviroment, etc.). this analysis guarantees the post-irr adiation parameter limits specified in table i. c. rha testing shall be performed at the component leve l for initial device qualification, and after design changes that may affect the rha performance of the device. as an alternative to testing, components may be procured to manufacturer radiation guarantees that meet the minimum performance requirements. component radiation performance guarantees shall be established in compli ance with mil-prf-19500, group d or mil-prf-38535, group e, as applicable. for components with less than adequate performance margin, component lot radiation acceptance screening shall be performed. d. the manufacturer shall establish procedures controlling component radiation testing, and shall establish radiation test plans used to implement component lot qualification during procurement. test plans and test reports shall be filed and controlled in accordance with the manufacturer's configuration management system. e. the device manufacturer shall designate a rha program manager to oversee component lot qualification, and to monitor design changes for continued compliance to rha requirements. 5. packaging 5.1 packaging requirements . the requirements for packaging shall be in accordance with mil-prf-38534. 6. notes 6.1 intended use . microcircuits conforming to this drawing are intended for use for gove rnment microcircuit applications (original equipment), design applic ations, and logistics purposes.
standard microcircuit drawing size a 5962-01501 defense supply center columbus columbus, ohio 43216-5000 revision level a sheet 13 dscc form 2234 apr 97 6.2 replaceability . microcircuits covered by this drawing will repl ace the same generic device covered by a contractor- prepared specification or drawing. 6.3 configuration control of smd's . all proposed changes to existing smd's w ill be coordinated as specified in mil-prf- 38534. 6.4 record of users . military and industrial users shall inform defens e supply center columbus when a system application requires configuration control and the applicable smd. dscc w ill maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. us ers of drawings covering micr oelectronic devices (fsc 5962) should contact dscc-va, telephone (614) 692-0544. 6.5 comments . comments on this drawing should be directed to dscc-va, columbus, ohio 43216-5000, or telephone (614) 692-0512. 6.6 sources of supply . sources of supply are listed in mil-hdbk- 103 and qml-38534. the vendors listed in mil-hdbk- 103 and qml-38534 have submitted a certificate of compliance (s ee 3.7 herein) to dscc-va and have agreed to this drawing.
standard microcircuit drawing bulletin date: 01-10-26 approved sources of supply for smd 5962-01501 are listed below for immediate acquisition information only and shall be added to mil-hdbk-103 and qml-38534 during the next revisions. mil-hdbk-103 and qml-38534 will be revised to include the addition or deletion of sources. the vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accept ed by dscc-va. this bulletin is superseded by the next dated revisions of mil-hdbk-103 and qml-38534. standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-0150101hxa 5962-0150101hxc 5962-0150101hza 5962-0150101hzc 50821 50821 50821 50821 mtr283r3s/883 mtr283r3s/883 mtr283r3sf/883 mtr283r3sf/883 5962-0150102hxa 5962-0150102hxc 5962-0150102hza 5962-0150102hzc 50821 50821 50821 50821 smtr283r3s/ho smtr283r3s/ho smtr283r3sf/ho smtr283r3sf/ho 5962r0150102hxa 5962R0150102HXC 5962r0150102hza 5962r0150102hzc 50821 50821 50821 50821 smtr283r3s/hr smtr283r3s/hr smtr283r3sf/hr smtr283r3sf/hr 5962r0150102kxa 5962r0150102kxc 5962r0150102kza 5962r0150102kzc 50821 50821 50821 50821 smtr283r3s/kr smtr283r3s/kr smtr283r3sf/kr smtr283r3sf/kr 1 / the lead finish shown for each pin representing a herme tic package is the most readily available from the manufacturer listed for that part. if the desired lead fini sh is not listed contact t he vendor to determine its availability. 2 / caution . do not use this number for it em acquisition. items acquired to this number may not satisfy the performance requirements of this drawing. vendor cage vendor name number and address 50821 interpoint corporation 10301 willows road redmond, wa 98073-9705 the information contained herein is disseminated for convenience only and the government assumes no liability whatsoever for any inaccuracies in the information bulletin.

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